prEN IEC 63551-5:2026

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices prEN IEC 63551-5:2026

Publication date:   Jul 17, 2026

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40.20   DIS ballot initiated: 12 weeks   Jul 17, 2026

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CLC/TC 47X

European Norm

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prEN IEC 63551-5:2026
40.20 DIS ballot initiated: 12 weeks
Jul 17, 2026




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