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prEN IEC 63551-1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-pd for lidar prEN IEC 63551-1

General information

10.99   New project approved   Feb 19, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
prEN IEC 63551-1
10.99 New project approved
Feb 19, 2024




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