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prEN IEC 63550-6

Semiconductor devices-neuromorphic devices - Part 6：evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays prEN IEC 63550-6

General information

10.99   New project approved   Mar 23, 2026

CENELEC

CLC/TC 47X

European Norm

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
prEN IEC 63550-6
10.99 New project approved
Mar 23, 2026




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