prEN IEC 63470:2026

Guideline for gate oxide reliability and robustness evaluation procedures for silicon carbide power mosfets (Fast Track)

Publication date:   Jul 17, 2026

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40.20   DIS ballot initiated: 12 weeks   Jul 17, 2026

CENELEC

CLC/TC 47X

European Norm

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prEN IEC 63470:2026
40.20 DIS ballot initiated: 12 weeks
Jul 17, 2026