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prEN IEC 63364-2

Semiconductor devices - Semiconductor devices for iot system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment prEN IEC 63364-2

General information

10.99   New project approved   Jul 21, 2025

CENELEC

CLC/TC 47X

European Norm

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
prEN IEC 63364-2
10.99 New project approved
Jul 21, 2025




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