prEN IEC 63284:2021

Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors prEN IEC 63284:2021

General information

Current stage: 40.98 Project deleted May 26, 2021

Originator: CENELEC

Owner: CLC/SR 47 Semiconductor devices

Type: European Norm

Scope

This document covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of Gallium Nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress.

Life cycle

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ABANDON
prEN IEC 63284:2021
40.98 Project deleted
May 26, 2021

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