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prEN IEC 61967-1

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

General information

10.99   New project approved   Jan 13, 2025

CENELEC

CLC/TC 47X

European Norm

31.200   Integrated circuits. Microelectronics

Life cycle

PREVIOUSLY

PUBLISHED
EN IEC 61967-1:2019

NOW

IN_DEVELOPMENT
prEN IEC 61967-1
10.99 New project approved
Jan 13, 2025