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prEN IEC 60747-14-16

Semiconductor devices - Part 14-16: Semiconductor sensors - Performance test method for capacitive fingerprint sensors

General information

10.99   New project approved   Aug 31, 2026

CENELEC

CLC/TC 47X

European Norm

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
prEN IEC 60747-14-16
10.99 New project approved
Aug 31, 2026