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prEN 60749-28

prEN 60749-28

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM)

General information

Current stage: 40.98 Project deleted Oct 18, 2005

Originator: CENELEC

Owner: CLC/SR 47 Semiconductor devices

Type: European Norm

Life cycle

NOW

ABANDON
prEN 60749-28
40.98 Project deleted
Oct 18, 2005