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PNW 47E-494 ED1

Future IEC 60747-14-x: Semiconductor devices - Part 14-x: Semiconductor sensor - Test method of eutectic bonding for sensors

General information

10.98   New project rejected   Apr 3, 2015

IEC

TC 47/SC 47E

International Standard

Life cycle

NOW

ABANDON
PNW 47E-494 ED1
10.98 New project rejected
Apr 3, 2015