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PNW 47A-1131 ED1

Integrated circuits – Fault test method for semiconductor devices and ICs by electromagnetic immunity from automotive RADAR

General information

10.98   New project rejected   Apr 22, 2022

IEC

TC 47/SC 47A

International Standard

Life cycle

NOW

ABANDON
PNW 47A-1131 ED1
10.98 New project rejected
Apr 22, 2022