0

PNW 47A-1131 ED1

Integrated circuits – Fault test method for semiconductor devices and ICs by electromagnetic immunity from automotive RADAR PNW 47A-1131 ED1

General information

10.98   New project rejected   Apr 22, 2022

IEC

TC 47/SC 47A

International Standard

Life cycle

NOW

ABANDON
PNW 47A-1131 ED1
10.98 New project rejected
Apr 22, 2022




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.

Google Play App Store Web Version