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PNW 47-2749 ED1

Semiconductor devices - Fault test method for semiconductor devices in automotive vehicles - Part 1: General conditions and definitions

General information

10.98   New project rejected   Aug 5, 2022

IEC

TC 47

International Standard

Life cycle

NOW

ABANDON
PNW 47-2749 ED1
10.98 New project rejected
Aug 5, 2022