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PNW 47-2291 ED1

Semiconductor devices - Reliability of automotive semiconductors - Part 1: Estimating aging level of automotive semiconductors

General information

10.98   New project rejected   Dec 23, 2016

IEC

TC 47

International Standard

Life cycle

NOW

ABANDON
PNW 47-2291 ED1
10.98 New project rejected
Dec 23, 2016