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ISO/NP TS 23473

Surface chemical analysis — Depth profiling — Estimation of atomic fractions of multi-element alloy films by depth profiling analysis using reference materials

General information

10.98   New project rejected   Jul 28, 2020

ISO

ISO/TC 201/SC 4 Depth profiling

Technical Specification

Life cycle

NOW

ABANDON
ISO/NP TS 23473
10.98 New project rejected
Jul 28, 2020