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ISO/DTS 23879

Nanotechnologies — Structural characterization of graphene oxide flakes — Thickness and lateral size measurement using atomic force microscopy and scanning electron microscopy ISO/DTS 23879

General information

50.00   Final text received or FDIS registered for formal approval   Jul 17, 2026

ISO

ISO/TC 229 Nanotechnologies

Technical Specification

07.120   Nanotechnologies

Scope

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

Life cycle

NOW

IN_DEVELOPMENT
ISO/DTS 23879
50.00 Final text received or FDIS registered for formal approval
Jul 17, 2026




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