This document specifies a method for the determination of chemical components of titanium (Ti), vanadium (V), tungsten (W), molybdenum (Mo), silicon (Si), and aluminium (Al) in selective catalytic reduction (SCR) catalyst and intermediates by wavelength dispersive X-ray Fluorescence spectrometer (WD-XRF).
IN_DEVELOPMENT
ISO/DIS 25515
40.20
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Aug 27, 2026