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ISO/CD 15905

Surface chemical analysis — Sputter depth profiling optimization using single layer films on a substrate as reference materials (combined with ISO/WI 14606)

General information

30.98 Project deleted   Oct 16, 1998

ISO

ISO/TC 201/SC 4 Depth profiling

International Standard

71.040.40   Chemical analysis

Life cycle

NOW

ABANDON
ISO/CD 15905
30.98 Project deleted
Oct 16, 1998