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ISO 24173:2009

Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction ISO 24173:2009

Publication date:   Sep 14, 2009

95.99 Withdrawal of Standard   Feb 9, 2024

General information

95.99 Withdrawal of Standard   Feb 9, 2024

ISO

ISO/TC 202 Microbeam analysis

International Standard

71.040.50   Physicochemical methods of analysis

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Scope

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Life cycle

NOW

WITHDRAWN
ISO 24173:2009
95.99 Withdrawal of Standard
Feb 9, 2024

REVISED BY

PUBLISHED
ISO 24173:2024