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ISO 23729:2022

Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size ISO 23729:2022

Publication date:   Jul 13, 2022

General information

60.60 Standard published   Jul 13, 2022

ISO

ISO/TC 201/SC 9 Scanning probe microscopy

International Standard

71.040.40   Chemical analysis

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Scope

This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.

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PUBLISHED
ISO 23729:2022
60.60 Standard published
Jul 13, 2022