ISO 18516:2006

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Determination of lateral resolution

Publication date:   Oct 19, 2006

95.99 Withdrawal of Standard   Jan 14, 2019

General information

95.99 Withdrawal of Standard   Jan 14, 2019

ISO

ISO/TC 201/SC 2 General procedures

International Standard

71.040.40   Chemical analysis

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Scope

ISO 18516:2006 describes three methods for measuring the lateral resolution achievable in Auger electron spectrometers and X-ray photoelectron spectrometers under defined settings. The straight-edge method is suitable for instruments where the lateral resolution is expected to be larger than 1 micrometre. The grid method is suitable if the lateral resolution is expected to be less than 1 micrometre but more than 20 nm. The gold-island method is suitable for instruments where the lateral resolution is expected to be smaller than 50 nm.
Annexes A, B and C provide illustrative examples of the measurement of lateral resolution.

Life cycle

NOW

WITHDRAWN
ISO 18516:2006
95.99 Withdrawal of Standard
Jan 14, 2019

REVISED BY

PUBLISHED
ISO 18516:2019