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ISO 17901-2:2015

Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics ISO 17901-2:2015

Publication date:   Jun 29, 2015

General information

90.93   Standard confirmed   Nov 7, 2025

ISO

ISO/TC 172/SC 9 Laser and electro-optical systems

International Standard

31.020   Electronic components in general

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Published

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Scope

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

Life cycle

NOW

PUBLISHED
ISO 17901-2:2015
90.93 Standard confirmed
Nov 7, 2025




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