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ISO 16526-1:2011

Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 1: Voltage divider method ISO 16526-1:2011

Publication date:   Dec 15, 2011

General information

90.20   Standard under periodical review   Jul 15, 2026

ISO

ISO/TC 135/SC 5 Radiographic testing

International Standard

19.100   Non-destructive testing

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Published

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Scope

ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.
This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.

Life cycle

NOW

PUBLISHED
ISO 16526-1:2011
90.20 Standard under periodical review
Jul 15, 2026

Relations

Adopted from EN 12544-1:1999




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