ISO 13067:2020

Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size

Publication date:   Jul 15, 2020

General information

90.92 Standard to be revised   Oct 30, 2024

ISO

ISO/TC 202 Microbeam analysis

International Standard

71.040.50   Physicochemical methods of analysis

Buying

  Published

PDF - €156.09

  English  



Buy

Scope

This document describes procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD). This requires the measurement of orientation, misorientation and pattern quality factor as a function of position in the crystalline specimen[1]. The measurements in this document are made on two dimensional sections. The reader should note carefully the definitions used (3.3) which draw a distinction between the measured sectional grain sizes, and the mean grain size which can be derived from them that relates to the three dimensional grain size.
NOTE 1 While conventional methods for grain size determination using optical microscopy are well-established, EBSD methods offer a number of advantages over these techniques, including increased spatial resolution and quantitative description of the orientation of the grains.
NOTE 2 The method also lends itself to the measurement of the grain size of complex materials, for example those with a significant duplex content.
NOTE 3 The reader is warned to interpret the results with care when attempting to investigate specimens with high levels of deformation.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 13067:2011

NOW

PUBLISHED
ISO 13067:2020
90.92 Standard to be revised
Oct 30, 2024

REVISED BY

IN_DEVELOPMENT
ISO/AWI 13067