ISO 11505:2012

Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry ISO 11505:2012

Publication date:   Dec 12, 2012

Scope

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.