Menu

0

IEC TS 62607-12-01 ED1

Nanomanufacturing - Key control characteristics - Part 12-01: 2D material-related products - Density of interface trapped charges: I-V curve analysis of field effect transistors

General information

30.60   Close of voting/ comment period   Aug 7, 2026

IEC

TC 113

Technical Specification

Life cycle

NOW

IN_DEVELOPMENT
IEC TS 62607-12-01 ED1
30.60 Close of voting/ comment period
Aug 7, 2026