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IEC TS 62228:2007 ED1

Integrated circuits - EMC evaluation of CAN transceivers IEC TS 62228:2007 ED1

Publication date:   Feb 16, 2007

General information

99.60   Withdrawal effective   Mar 11, 2019

IEC

TC 47/SC 47A

Technical Specification

31.200   Integrated circuits. Microelectronics

Buying

Replaced

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Scope

Specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers concerning: - immunity against RF common mode disturbances on the signal lines - emissions caused by non-symmetrical signals regarding the time and frequency domain - immunity against transients (function and damage) - immunity against electrostatic discharges - ESD (damage)

Life cycle

NOW

WITHDRAWN
IEC TS 62228:2007 ED1
99.60 Withdrawal effective
Mar 11, 2019

REVISED BY

PUBLISHED
IEC 62228-3:2019 ED1




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