60.60 Standard published Mar 10, 2000
IEC
Technical Specification
31.200 Integrated circuits. Microelectronics
Published
Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.
PUBLISHED
IEC TS 61945:2000 ED1
60.60
Standard published
Mar 10, 2000