To develop a revised Substrate Bending Test for multilayer
ceramic surface mount capacitors, to possibly replace the present
TC 40 test method (IEC 384-1, Amendment 3, clause 4.35 and IEC
115-1, Amendment 3, clause 4.33) and IEC 68-2-21, Amendment 2,
Test Ue1 IEC TR 60384-1-1 ED1
