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IEC 63673 ED1

Guidelines for Gate Charge (Q<sub>G</sub>) test method for SIC MOSFET (Fast Track) IEC 63673 ED1

General information

40.60   Close of voting   Nov 28, 2025

IEC

TC 47

International Standard

Life cycle

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IN_DEVELOPMENT
IEC 63673 ED1
40.60 Close of voting
Nov 28, 2025




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