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IEC 63608-2 ED1

Semiconductor devices - Reliability test methods for vibration energy harvesters - Part 2: Temperature and humidity

General information

30.60   Close of voting/ comment period   Aug 7, 2026

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

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IEC 63608-2 ED1
30.60 Close of voting/ comment period
Aug 7, 2026