IEC 63581-1 ED1

Semiconductor devices - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 1: Classification of defects IEC 63581-1 ED1

Current stage: 40.60 Close of voting Jan 30, 2026

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

IN_DEVELOPMENT
IEC 63581-1 ED1
40.60 Close of voting
Jan 30, 2026

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