IEC 63551-5 ED1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices

General information

40.20   DIS ballot initiated: 12 weeks   Jul 17, 2026

PRVC    Oct 9, 2026

IEC

TC 47

International Standard

Life cycle

NOW

IN_DEVELOPMENT
IEC 63551-5 ED1
40.20 DIS ballot initiated: 12 weeks
Jul 17, 2026