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IEC 63551-2 ED1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of LiDAR

General information

30.60   Close of voting/ comment period   Jul 24, 2026

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

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IN_DEVELOPMENT
IEC 63551-2 ED1
30.60 Close of voting/ comment period
Jul 24, 2026