IEC 63551-1 ED1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR

Current stage: 40.00 DIS registered Jul 31, 2026

Next stage: CCDV Next stage date : Sep 18, 2026

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

IN_DEVELOPMENT
IEC 63551-1 ED1
40.00 DIS registered
Jul 31, 2026