IEC 63550-6 ED1

Semiconductor devices - Neuromorphic devices - Part 6:Evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays

General information

30.20   CD study/ballot initiated   Sep 4, 2026

PCC    Oct 30, 2026

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
IEC 63550-6 ED1
30.20 CD study/ballot initiated
Sep 4, 2026