IEC 63550-5 ED1

<p>Semiconductor devices - Neuromorphic devices - Part 5: Evaluation method of endurance and retention in memristor devices</p> IEC 63550-5 ED1

Current stage: 30.20 CD study/ballot initiated Sep 4, 2026

Next stage: PCC Next stage date : Oct 30, 2026

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

IN_DEVELOPMENT
IEC 63550-5 ED1
30.20 CD study/ballot initiated
Sep 4, 2026

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