IEC 63550-1 ED1

Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices IEC 63550-1 ED1

General information

40.99   Full report circulated: DIS approved for registration as FDIS   Aug 14, 2026

DECFDIS    Aug 28, 2026

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
IEC 63550-1 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
Aug 14, 2026




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