IEC 63405 ED1

High-voltage test techniques - Capacitance and dielectric loss measurements

Current stage: 50.00 Final text received or FDIS registered for formal approval Aug 5, 2026

Next stage: CFDIS Next stage date : Oct 28, 2026

Originator: IEC

Owner: TC 42

Type: International Standard

IN_DEVELOPMENT
IEC 63405 ED1
50.00 Final text received or FDIS registered for formal approval
Aug 5, 2026