IEC 63364-2 ED1

Semiconductor devices - Semiconductor devices for IoT system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment

Current stage: 30.99 CD approved for registration as DIS Mar 27, 2026

Next stage: TCDV Next stage date : Dec 31, 2026

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

IN_DEVELOPMENT
IEC 63364-2 ED1
30.99 CD approved for registration as DIS
Mar 27, 2026