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IEC 63364-2 ED1

Semiconductor devices - Semiconductor devices for IoT system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment IEC 63364-2 ED1

General information

30.99   CD approved for registration as DIS   Mar 27, 2026

TCDV    Dec 31, 2026

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
IEC 63364-2 ED1
30.99 CD approved for registration as DIS
Mar 27, 2026




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