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IEC 62969-4:2018 ED1

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors IEC 62969-4:2018 ED1

Publication date:   Jun 18, 2018

General information

60.60   Standard published   Jun 18, 2018

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

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IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

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PUBLISHED
IEC 62969-4:2018 ED1
60.60 Standard published
Jun 18, 2018




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