IEC 62951-7:2019 ED1

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor

Publication date:   Feb 27, 2019

General information

60.60   Standard published   Feb 27, 2019

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

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Scope

IEC 62951-7:2019 specifies evaluation conditions and gives a method of measurement as well as a test set-up for the measurement of barrier performance for thin-film layer with ultra‑low permeation rate under both flat and bending conditions. This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures. For these purposes, this document provides terms, definitions, symbols, configurations, and test methods including test conditions such as temperature, relative humidity, testing time.

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PUBLISHED
IEC 62951-7:2019 ED1
60.60 Standard published
Feb 27, 2019