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IEC 62951-6:2019 ED1

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films IEC 62951-6:2019 ED1

Publication date:   May 6, 2019

General information

60.60   Standard published   May 6, 2019

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

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Scope

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

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PUBLISHED
IEC 62951-6:2019 ED1
60.60 Standard published
May 6, 2019




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