IEC 62951-3:2018 ED1

Name: IEC 62951-3:2018 ED1
Brand: IEC
SKU: IEC 62951-3:2018 ED1
Price: 193.6 EUR
Availability: InStock
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Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

Publication date: Nov 7, 2018

General information

Current stage: 60.60 Standard published Nov 7, 2018

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

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Status: Published

PDF - €193.60

Languages: English

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Scope

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

Life cycle

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PUBLISHED
IEC 62951-3:2018 ED1
60.60 Standard published
Nov 7, 2018