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IEC 62951-2:2019 ED1

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices IEC 62951-2:2019 ED1

Publication date:   Apr 17, 2019

General information

60.60   Standard published   Apr 17, 2019

IEC

TC 47

International Standard

31.080.99   Other semiconductor devices

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Scope

IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin‑film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.

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PUBLISHED
IEC 62951-2:2019 ED1
60.60 Standard published
Apr 17, 2019




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