IEC 62435-2:2017 ED1

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms IEC 62435-2:2017 ED1

Publication date:   Jan 24, 2017

Scope

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.