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IEC 62433-3:2017 ED1

EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) IEC 62433-3:2017 ED1

Publication date:   Jan 27, 2017

General information

60.60   Standard published   Jan 27, 2017

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics | 33.100.10   Emission

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Scope

IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.

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PUBLISHED
IEC 62433-3:2017 ED1
60.60 Standard published
Jan 27, 2017




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