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IEC 62228-2:2016 ED1

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers IEC 62228-2:2016 ED1

Publication date:   Nov 18, 2016

General information

60.60 Standard published   Nov 18, 2016

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).

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PUBLISHED
IEC 62228-2:2016 ED1
60.60 Standard published
Nov 18, 2016