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IEC 62215-3:2013 ED1

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method IEC 62215-3:2013 ED1

Publication date:   Jul 17, 2013

General information

60.60 Standard published   Jul 17, 2013

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

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PUBLISHED
IEC 62215-3:2013 ED1
60.60 Standard published
Jul 17, 2013